Composition and strain in SiGe/Si(001) "nanorings" revealed by combined x-ray and selective wet chemical etching methods

Stoffel, M. ; Malachias, A. ; Rastelli, A. ; Metzger, T. H. ; Schmidt, O. G.

Applied physics letters, 2009-06, Vol.94 (25), p.253114-253114-3 [Periódico revisado por pares]

American Institute of Physics

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