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Construct validity of data from a TPACK self-assessment instrument in 2-year public college faculty in the United States

Scott, Kristin C. ; Nimon, Kim

Journal of research on technology in education, 2020-08, Vol.53 (4), p.427-445 [Periódico revisado por pares]

Eugene: Routledge

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Título:
Construct validity of data from a TPACK self-assessment instrument in 2-year public college faculty in the United States
Autor: Scott, Kristin C. ; Nimon, Kim
Assuntos: College Faculty ; Community colleges ; Construct Validity ; Educational Needs ; Factor Analysis ; Faculty Development ; Goodness of Fit ; higher education ; Intervention ; learner-centered principles ; Pedagogical Content Knowledge ; professional development ; Reliability ; Self evaluation ; Self Evaluation (Individuals) ; Student Centered Learning ; student success ; Teacher Attitudes ; Teacher Surveys ; Teaching Methods ; Technological Literacy ; Technological pedagogical content knowledge ; Technology Integration ; TPACK ; Two Year Colleges
É parte de: Journal of research on technology in education, 2020-08, Vol.53 (4), p.427-445
Descrição: Mishra and Koehler's technological pedagogical content knowledge (TPACK) theory can help provide the framework for measuring needed knowledge, skills, and abilities (KSAs) in faculty members at 2-year public colleges. This study tests a self-assessment survey in a large sample of 2-year public college faculty members. Using factor analysis, the Community College TPACK Survey for Meaningful Learning (CC-TSML) is found to demonstrate internal reliability, adequate model fit, and composite reliability. Use of this instrument can help faculty members and administrators determine what type of interventions may be necessary to help faculty achieve the needed KSAs as measured by the CC-TSML, including professional development.
Editor: Eugene: Routledge
Idioma: Inglês

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Construct validity of data from a TPACK self-assessment instrument in 2-year public college faculty in the United States

Scott, Kristin C. ; Nimon, Kim

Eugene: Routledge

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