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Electron beam induced current investigations of Pt/SrTiO3−x interface exposed to chemical and electrical stresses

Jiang, W. ; Evans, D. ; Bain, J. A. ; Skowronski, M. ; Salvador, P. A.

Applied physics letters, 2010-03, Vol.96 (9) [Periódico revisado por pares]

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Título:
Electron beam induced current investigations of Pt/SrTiO3−x interface exposed to chemical and electrical stresses
Autor: Jiang, W. ; Evans, D. ; Bain, J. A. ; Skowronski, M. ; Salvador, P. A.
É parte de: Applied physics letters, 2010-03, Vol.96 (9)
Descrição: Pt Schottky contacts were fabricated on oxygen deficient SrTiO3−x [001] single crystals. Electron beam induced current (EBIC) and atomic force microscopy images taken on etched SrTiO3 (001) surfaces revealed that the dark {001} oriented lines observed in EBIC correlate with arrays of dislocation etch pits. Annealing contacts in air (at 120 °C for 10 min) changed the dislocation-related EBIC contrast from dark to bright. Electrically stressing the air-annealed Schottky contacts at −10 V for 1 h caused the dislocation-related EBIC contrast to return to dark. The contrast changes are interpreted as arising from oxygen vacancy motion in response to chemical or electrical stresses.
Idioma: Inglês

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