Point Defects in Pb-, Bi-, and In-Doped CdZnTe Detectors: Deep-Level Transient Spectroscopy (DLTS) Measurements

Gul, R. ; Keeter, K. ; Rodriguez, R. ; Bolotnikov, A.E. ; Hossain, A. ; Camarda, G.S. ; Kim, K.H. ; Yang, G. ; Cui, Y. ; Carcelen, V. ; Franc, J. ; Li, Z. ; James, R.B.

Journal of electronic materials, 2012-03, Vol.41 (3), p.488-493 [Periódico revisado por pares]

Boston: Springer US

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