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Reflection and Absorption Techniques for Optical Characterization of Chemically Assembled Nanomaterials

Roy, D. ; Fendler, J.

Advanced materials (Weinheim), 2004-03, Vol.16 (6), p.479-508 [Periódico revisado por pares]

Weinheim: WILEY-VCH Verlag

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  • Título:
    Reflection and Absorption Techniques for Optical Characterization of Chemically Assembled Nanomaterials
  • Autor: Roy, D. ; Fendler, J.
  • Assuntos: Infrared ellipsometry ; Infrared reflection absorption spectroscopy ; metal ; Monolayer-protected clusters ; Nanoparticles ; Nanoparticles, metal ; Optical characterization ; Self-assembled monolayers (SAMs) ; Surface plasmon resonance spectroscopy
  • É parte de: Advanced materials (Weinheim), 2004-03, Vol.16 (6), p.479-508
  • Notas: istex:479906E1B76D716C7E1CE42C465CF469EF26E6C8
    ark:/67375/WNG-V6QWZ688-T
    ArticleID:ADMA200306195
    We thank the US Department of Energy for supporting this work. A list of abbreviations and definitions is available online from Wiley InterScience as supporting information or from the authors.
    ObjectType-Article-2
    SourceType-Scholarly Journals-1
    ObjectType-Feature-1
    content type line 23
  • Descrição: This review discusses recent developments in the areas of fabrication, certain types of optical characterization, and applications of a selected class of chemically assembled nanomaterials, namely i) gold and silver nanoparticles deposited onto optically transparent glass substrates; ii) thiol‐functionalized self‐assembled monolayers (SAMs); iii) chemically stabilized gold and silver nanoparticles (monolayer protected clusters, MPCs); and iv) MPCs linked to metallic substrates and adsorbates. Six linear optical techniques for the characterization of these materials are discussed: transmission localized surface plasmon resonance spectroscopy, T‐LSPR; propagating surface plasmon resonance spectroscopy, P‐SPR; polarization‐selective Fourier transform infrared reflection absorption spectroscopy, PS‐FTIRRAS; polarization‐modulation Fourier transform infrared reflection absorption spectroscopy, PM‐FTIRRAS; surface‐enhanced infrared reflection absorption spectroscopy, SEIRRAS; and infrared ellipsometry. The review focuses particularly on providing a unified treatment of these six optical techniques by using a relatively simple stratified multilayer model. A unified treatment is presented for a number of optical characterization techniques, including surface plasmon resonance spectroscopies (T‐LSPR and P‐SPR), infrared reflection absorption spectroscopies (PS‐FTIRRAS, PM‐ FTIRRAS, and SEIRRAS), and infrared ellipsometry. Selected applications of these techniques are illustrated for the characterization of monolayer protected clusters (MPCs), self‐assembled monolayers (SAMs), and related nanostructures (see Figure).
  • Editor: Weinheim: WILEY-VCH Verlag
  • Idioma: Inglês
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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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