Standard for Test Methods for the Characterization of Organic Transistors and Materials

IEEE Std 1620-2004, 2004, p.1-20

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Título:
Standard for Test Methods for the Characterization of Organic Transistors and Materials
Assuntos: FETs ; field-effect transistor ; IEEE standards ; Measurement errors ; Measurement standards ; organic electronic technology ; organic materials ; organic semiconductor technology ; organic transis-tors ; polymer field-effect transistor
É parte de: IEEE Std 1620-2004, 2004, p.1-20
Notas: Standard Number: 31.080.30
Descrição: This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
Editor: IEEE
Idioma: Inglês

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