Stress and bias field dependence of initial permeability in amorphous Co75-xFexSi15B10

ALLIA, P ; CRUZ FILHO, S. P ; KNOBEL, M ; SATO TURTELLI, R ; SINNECKER, J. P ; VINAI, F

IEEE transactions on magnetics, 1994, Vol.30 (2), p.480-482

New York, NY: Institute of Electrical and Electronics Engineers

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