Optimum Bias Load-Line Compensates Temperature Variation of Junction Diode's RF Resistance

Bera, S.C. ; Singh, R.V. ; Garg, V.K. ; Sharma, S.B.

IEEE transactions on microwave theory and techniques, 2007-02, Vol.55 (2), p.215-221 [Periódico revisado por pares]

New York, NY: IEEE

Texto completo disponível