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Techniques of the FLASH thin target experiment

Abbasi, R. ; Abu-Zayyad, T. ; Belov, K. ; Belz, J. ; Bergman, D.R. ; Cao, Z. ; Chang, F.-Y. ; Chen, C.-C. ; Chen, C.-W. ; Chen, P. ; Dalton, M. ; Fedorova, Y. ; Field, C. ; Hast, C. ; Huang, M.A. ; Hüntemeyer, P. ; Hwang, W.-Y.P. ; Iverson, R. ; Jones, B.F. ; Jui, C.C.H. ; Lin, G.-L. ; Loh, E.C. ; Manago, N. ; Martens, K. ; Matthews, J.N. ; Maestas, M. ; Ng, J.S.T. ; Odian, A. ; Reil, K. ; Rodriguez, D. ; Smith, J. ; Sokolsky, P. ; Springer, R.W. ; Thomas, J. ; Thomas, S. ; Thomson, G. ; Walz, D. ; Zech, A.

Nucl.Instrum.Meth.A597:32-36,2008, 2008-11, Vol.597 (1), p.32-36 [Periódico revisado por pares]

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Título:
Techniques of the FLASH thin target experiment
Autor: Abbasi, R. ; Abu-Zayyad, T. ; Belov, K. ; Belz, J. ; Bergman, D.R. ; Cao, Z. ; Chang, F.-Y. ; Chen, C.-C. ; Chen, C.-W. ; Chen, P. ; Dalton, M. ; Fedorova, Y. ; Field, C. ; Hast, C. ; Huang, M.A. ; Hüntemeyer, P. ; Hwang, W.-Y.P. ; Iverson, R. ; Jones, B.F. ; Jui, C.C.H. ; Lin, G.-L. ; Loh, E.C. ; Manago, N. ; Martens, K. ; Matthews, J.N. ; Maestas, M. ; Ng, J.S.T. ; Odian, A. ; Reil, K. ; Rodriguez, D. ; Smith, J. ; Sokolsky, P. ; Springer, R.W. ; Thomas, J. ; Thomas, S. ; Thomson, G. ; Walz, D. ; Zech, A.
Assuntos: AIR ; Air fluorescence ; ATMOSPHERIC PRESSURE ; CALIBRATION ; ELECTRON BEAMS ; FLUORESCENCE ; Fluorescence spectrum ; Instrumentation,ASTRO, INST ; LASERS ; NITROGEN ; PHOTONS ; PHYSICS OF ELEMENTARY PARTICLES AND FIELDS ; PRESSURE RANGE ; RAYLEIGH SCATTERING ; TARGETS ; Ultra-high energy cosmic rays ; WAVELENGTHS
É parte de: Nucl.Instrum.Meth.A597:32-36,2008, 2008-11, Vol.597 (1), p.32-36
Notas: USDOE
AC02-76SF00515
SLAC-PUB-12928
Descrição: The fluorescence yield in air is reported for wavelength and pressure ranges of interest to ultra-high energy cosmic ray detectors. A 28.5 GeV electron beam was used to excite the fluorescence. Central to the approach was the system calibration, using Rayleigh scattering of a nitrogen laser beam. In atmospheric pressure dry air, at 304 K, the yield is 20.8 ± 1.6 photons per MeV.
Editor: United States: Elsevier B.V
Idioma: Inglês

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