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Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector

Baker, Jessy L ; Jimison, Leslie H ; Mannsfeld, Stefan ; Volkman, Steven ; Yin, Shong ; Subramanian, Vivek ; Salleo, Alberto ; Alivisatos, A. Paul ; Toney, Michael F

Langmuir, 2010-06, Vol.26 (11), p.9146-9151 [Periódico revisado por pares]

Washington, DC: American Chemical Society

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Título:
Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector
Autor: Baker, Jessy L ; Jimison, Leslie H ; Mannsfeld, Stefan ; Volkman, Steven ; Yin, Shong ; Subramanian, Vivek ; Salleo, Alberto ; Alivisatos, A. Paul ; Toney, Michael F
Assuntos: Chemistry ; Colloidal state and disperse state ; Devices and Applications: Sensors, Fluidics, Patterning, Catalysis, Photonic Crystals ; Exact sciences and technology ; FIBERS ; General and physical chemistry ; grazing-incidence X-ray diffraction ; INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY ; MATERIALS SCIENCE ; MECHANICAL PROPERTIES ; MICROELECTRONICS ; MICROSTRUCTURE ; morphology ; NANOSCIENCE AND NANOTECHNOLOGY ; ORIENTATION ; OTHER INSTRUMENTATION ; Physical and chemical studies. Granulometry. Electrokinetic phenomena ; pole figure ; POLYMERS ; PROCESSING ; SOLAR CELLS ; SOLAR ENERGY ; Surface physical chemistry ; SYNCHROTRON RADIATION ; TEXTURE ; texture analysis ; thin film ; THIN FILMS ; X-RAY DIFFRACTION
É parte de: Langmuir, 2010-06, Vol.26 (11), p.9146-9151
Notas: ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
LBNL-3865E
Materials Sciences Division
DE-AC02-05CH11231
Descrição: As thin films become increasingly popular (for solar cells, LEDs, microelectronics, batteries), quantitative morphological and crystallographic information is needed to predict and optimize the film’s electrical, optical, and mechanical properties. This quantification can be obtained quickly and easily with X-ray diffraction using an area detector in two sample geometries. In this paper, we describe a methodology for constructing complete pole figures for thin films with fiber texture (isotropic in-plane orientation). We demonstrate this technique on semicrystalline polymer films, self-assembled nanoparticle semiconductor films, and randomly packed metallic nanoparticle films. This method can be immediately implemented to help understand the relationship between film processing and microstructure, enabling the development of better and less expensive electronic and optoelectronic devices.
Editor: Washington, DC: American Chemical Society
Idioma: Inglês

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Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector

Baker, Jessy L ; Jimison, Leslie H ; Mannsfeld, Stefan ; Volkman, Steven ; Yin, Shong ; Subramanian, Vivek ; Salleo, Alberto ; Alivisatos, A. Paul ; Toney, Michael F

Washington, DC: American Chemical Society

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