Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector
Baker, Jessy L ; Jimison, Leslie H ; Mannsfeld, Stefan ; Volkman, Steven ; Yin, Shong ; Subramanian, Vivek ; Salleo, Alberto ; Alivisatos, A. Paul ; Toney, Michael F
Langmuir, 2010-06, Vol.26 (11), p.9146-9151 [Periódico revisado por pares]Washington, DC: American Chemical Society
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