Applications of Unsupervised Deep Transfer Learning to Intelligent Fault Diagnosis: A Survey and Comparative Study

Zhao, Zhibin ; Zhang, Qiyang ; Yu, Xiaolei ; Sun, Chuang ; Wang, Shibin ; Yan, Ruqiang ; Chen, Xuefeng

IEEE transactions on instrumentation and measurement, 2021, Vol.70, p.1-28 [Periódico revisado por pares]

New York: IEEE

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