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Atomic force microscopy in process engineering : introduction to AFM for improved processes and products

W. Richard Bowen; Nidal Hilal

Localização: IQSC - Inst. Química de São Carlos (624.182 B675a )(Acessar)

Título:
Atomic force microscopy in process engineering : introduction to AFM for improved processes and products
Autor: W. Richard Bowen; Nidal Hilal
Assuntos: Atomic force microscopy; MICROSCOPIA ELETRÔNICA; Production engineering
Notas: Includes bibliographical references and index.
Descrição: Basic principles of atomic force microscopy -- Measurement of particle and surface interactions using force microscopy -- Quantification of particle-bubble interactions using atomic force microscopy -- Investigating membranes and membrane processes with atomic force microscopy -- AFM and development of (bio) fouling-resistant membranes -- Nanoscale analysis of pharmaceuticals by scanning probe microscopy -- Micro/nanoengineering and AFM for cellular sensing -- Atomic force microscopy and polymers on surfaces -- Application of atomic force microscopy for the study of tensile and microrheological properties of fluids -- Future prospects.
Editor: Oxford ; Butterworth-Heinemann, Burlington, MA
Data de criação/publicação: 2009
Formato: xvi, 283 p. : ill. ; 24 cm..
Idioma: Inglês

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