Direct determination of strain and composition profiles in SiGe islands by anomalous x-Ray diffraction at high momentum transfer

Schülli, T U ; Stangl, J ; Zhong, Z ; Lechner, R T ; Sztucki, M ; Metzger, T H ; Bauer, G

Physical review letters, 2003-02, Vol.90 (6), p.066105-066105, Article 066105 [Periódico revisado por pares]

United States

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