Inhibition of intermetallic compounds growth at Sn–58Bi/Cu interface bearing CuZnAl memory particles (2–6 μm)
Zhang, Liang ; Liu, Zhi-quan
Journal of materials science. Materials in electronics, 2020-02, Vol.31 (3), p.2466-2480 [Periódico revisado por pares]New York: Springer US
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