Surface morphology analysis in correlation with crystallinity of CeO2(110) layers on Si(100) substrates
Inoue, T. ; Nakamura, T. ; Nihei, S. ; Kamata, S. ; Sakamoto, N. ; Yamamoto, Y.
Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2000-07, Vol.18 (4), p.1613-1618 [Periódico revisado por pares]Texto completo disponível