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Application of the high-pressure thermoelectric technique for characterization of semiconductor microsamples: PbX-based compounds

Ovsyannikov, Sergey V ; Shchennikov, Vladimir V ; Ponosov, Yuri S ; Gudina, Svetlana V ; Guk, Vera G ; Skipetrov, Eugenii P ; Mogilenskikh, Viktor E

Journal of physics. D, Applied physics, 2004-04, Vol.37 (8), p.1151-1157 [Peer Reviewed Journal]

Bristol: IOP Publishing

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