Toward robust and high-throughput detection of seed defects in X-ray images via deep learning
Hamdy, Sherif ; Charrier, Aurélie ; Corre, Laurence Le ; Rasti, Pejman ; Rousseau, David
Plant methods, 2024-05, Vol.20 (1), p.63-63, Article 63 [Periódico revisado por pares]England: BioMed Central Ltd
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