Photoluminescence and compositional-structural properties of ion-beam sputter deposited Er-doped TiO2-xNx films their potential as a temperature sensor
D. Scoca M Morales; R Merlo; F Alvarez; Antonio Ricardo Zanatta
Journal of Applied Physics College Park : American Institute of Physics - AIP v. 117, n. 20, p. 205304-1-205304-6, May 2015College Park 2015
Localização: IFSC - Inst. Física de São Carlos (PROD023597 )(Acessar)
- 0
- 1
- 2
- 3
- 4
- 5
- 6
- 7
- 8
- 9
- 10
- 11
- 12
- 13
- 14
- 15
- 16
- 17
- 18
- 19
- 20
- 21
- 22
- 23
- 24
- 25
- 26
- 27
- 28
- 29
- 30
- 31
- 32
- 33
- 34
- 35
- 36
- 37
- 38
- 39
prod023617
prod023557
browse_callnumber
display.do?vl(4708289UI0)=sub&gathStatTab=true&dscnt=0&callNumberBrowseField=browse_callnumber&mode=Basic&tabRealType=browseshelf&vid=USP&rfnGrp=1&rfnGrp=2&tab=usp_producao&vl(56004861UI1)=all_items&dstmp=1722215523678&rfnGrpCounter=1&scp.scps=scope%3A%28USP_PRODUCAO%29&fctV=Scoca%2C+D&fctV=Zanatta%2C+A&callNumber=prod023597&fctN=facet_creator&fctN=facet_creator&vl(freeText0)=Filmes%20Finos&ct=display&fn=search&indx=3&recIdxs=0&elementId=0