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Test volume and application time reduction through scan chain concealment

Bayraktaroglu, Ismet ; Orailoglu, Alex

Annual ACM IEEE Design Automation Conference: Proceedings of the 38th conference on Design automation, 2001, p.151-155

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Título:
Test volume and application time reduction through scan chain concealment
Autor: Bayraktaroglu, Ismet ; Orailoglu, Alex
Assuntos: Application software ; Applied computing -- Physical sciences and engineering -- Electronics ; Applied computing -- Physical sciences and engineering -- Engineering ; Automatic test pattern generation ; Circuit faults ; Circuit testing ; Compaction ; Computer science ; Fault detection ; Hardware -- Emerging technologies ; Hardware -- Robustness ; Permission ; Sequential analysis ; Test pattern generators
É parte de: Annual ACM IEEE Design Automation Conference: Proceedings of the 38th conference on Design automation, 2001, p.151-155
Notas: SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
Descrição: A test pattern compression scheme is proposed in order to reduce test data volume and application time. The number of scan chains that can be supported by an ATE is significantly increased by utilizing an on-chip decompressor. The functionality of the ATE is kept intact by moving the decompression task to the circuit under test. While the number of virtual scan chains visible to the ATE is kept small, the number of internal scan chains driven by the decompressed pattern sequence can be sinificantly increased.
Editor: New York, NY, USA: ACM
Idioma: Inglês

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