Bimodal size distribution in p− porous silicon studied by small angle X-ray scattering

Binder, M ; Edelmann, T ; Metzger, T.H ; Mauckner, G ; Goerigk, G ; Peisl, J

Thin solid films, 1996-04, Vol.276 (1-2), p.65-68 [Periódico revisado por pares]

Lausanne: Elsevier B.V

Texto completo disponível