Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode
HOSAKA, S ; SHINTANI, T ; MIYAMOTO, M ; HIROTSUNE, A ; TERAO, M ; YOSHIDA, M ; FUJITA, K ; KÄMMER, S
Japanese Journal of Applied Physics, 1996, Vol.35 (1B), p.443-447 [Periódico revisado por pares]Tokyo: Japanese journal of applied physics
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