Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2

Niu, Yue ; Gonzalez-Abad, Sergio ; Frisenda, Riccardo ; Marauhn, Philipp ; Drüppel, Matthias ; Gant, Patricia ; Schmidt, Robert ; Taghavi, Najme S. ; Barcons, David ; Molina-Mendoza, Aday J. ; De Vasconcellos, Steffen Michaelis ; Bratschitsch, Rudolf ; Perez De Lara, David ; Rohlfing, Michael ; Castellanos-Gomez, Andres

Nanomaterials (Basel, Switzerland), 2018-09, Vol.8 (9), p.725 [Peer Reviewed Journal]

Basel: MDPI AG

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