Solid State Excitation‐Emission Spectroscopy for the Non‐Destructive Analysis of Band‐Gap & Defect States in Inorganic and Organic Semiconductors

Oliver, Daniel J. ; Volkov, Victor V. ; Perry, Carole C.

Advanced materials interfaces, 2023-01, Vol.10 (3), p.n/a [Periódico revisado por pares]

Weinheim: John Wiley & Sons, Inc

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