A comparative TCAD simulations of a P-and N-type organic field effect transistors: field-dependent mobility, bulk and interface traps models

Boubaker, A. ; Hafsi, B. ; Lmimouni, K. ; Kalboussi, A.

Journal of materials science. Materials in electronics, 2017-02, Vol.28 (11), p.7834-7843 [Periódico revisado por pares]

Springer Verlag

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