Advanced sensors for scanning SQUID microscopy

Kirtley, J. R. ; Gibson, G. W. ; Fung, Y.-K.-K ; Klopfer, B. ; Nowack, K. ; Kratz, P. A. ; Mol, J.-M ; Arpes, J. ; Forooghi, F. ; Huber, M. E. ; Bluhm, H. ; Moler, K. A.

2013 IEEE 14th International Superconductive Electronics Conference (ISEC), 2013, p.1-2

IEEE

Texto completo disponível