Combining x-ray real and reciprocal space mapping techniques to explore the epitaxial growth of semiconductors

Magalhães, S ; Cabaço, J S ; Concepción, O ; Buca, D ; Stachowicz, M ; Oliveira, F ; Cerqueira, M F ; Lorenz, K ; Alves, E

Journal of physics. D, Applied physics, 2023-06, Vol.56 (24), p.245102 [Periódico revisado por pares]

IOP Publishing

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