Rotational positioning system adapted to atomic force microscope for measuring anisotropic surface properties

Liao, H.-S. ; Juang, B.-J. ; Chang, W.-C. ; Lai, W.-C. ; Huang, K.-Y. ; Chang, C.-S.

Review of scientific instruments, 2011-11, Vol.82 (11), p.113710-113710-5 [Periódico revisado por pares]

United States: American Institute of Physics

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