Ion-induced nanopatterns on semiconductor surfaces investigated by grazing incidence x-ray scattering techniques

Carbone, D ; Biermanns, A ; Ziberi, B ; Frost, F ; Plantevin, O ; Pietsch, U ; Metzger, T H

Journal of physics. Condensed matter, 2009-06, Vol.21 (22), p.224007-224007 (23) [Periódico revisado por pares]

England: IOP Publishing

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