Omnidirectional microscopy by ultrasonic sample control
Helander, P. ; Puranen, T. ; Meriläinen, A. ; Maconi, G. ; Penttilä, A. ; Gritsevich, M. ; Kassamakov, I. ; Salmi, A. ; Muinonen, K. ; Hæggström, E.
Applied physics letters, 2020-05, Vol.116 (19) [Revista revisada por pares]Melville: American Institute of Physics
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