Comparative study of the structure of a-CNx and a-CNx: H films using NEXAFS, XPS and FT-IR analysis

BOUCHET-FABRE, B ; ZELLAMA, K ; GODET, C ; BALLUTAUD, D ; MINEA, T

Thin solid films, 2005, Vol.482 (1-2), p.156-166 [Periódico revisado por pares]

Lausanne: Elsevier Science

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