Effect of pulsed UV laser irradiation on 4H-SiC MOS with thermal gate oxide
Luo, Zhipeng ; Wan, Caiping ; Xu, Hengyu ; Zhao, Fazhan ; Jin, Zhi
Journal of materials science. Materials in electronics, 2020-04, Vol.31 (8), p.5838-5842 [Periódico revisado por pares]New York: Springer US
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