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Preparation of BiSrCaCuO thin films by atomic layer-by-layer molecular-beam-epitaxy and high-resolution transmission electron microscopy analysis of the film/substrate interface and of growth defects

Dreßen, J. ; Zakharov, N.D. ; Hoffschulz, H. ; Stahl, H. ; Hesse, D. ; Güntherodt, G.

Journal of alloys and compounds, 1997-04, Vol.251 (1), p.44-47 [Peer Reviewed Journal]

Elsevier B.V

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