Impact of different transistor arrangements on gate variability
Zimpeck, A.L. ; Meinhardt, C. ; Artola, L. ; Hubert, G. ; Kastensmidt, F.L. ; Reis, R.A.L.
Microelectronics and reliability, 2018-09, Vol.88-90 (88–90), p.111-115
[Periódico revisado por pares]
Elsevier Ltd
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