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XRD, LPF and FTIR investigation of Mn-Bi alloy

Mishra, Ashutosh ; Patil, Harsha ; Jain, Garima

Journal of physics. Conference series, 2014-01, Vol.534 (1), p.12022-3 [Periódico revisado por pares]

Bristol: IOP Publishing

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Título:
XRD, LPF and FTIR investigation of Mn-Bi alloy
Autor: Mishra, Ashutosh ; Patil, Harsha ; Jain, Garima
Assuntos: Absorption spectra ; Alpha rays ; Bismuth base alloys ; Brakes ; Detectors ; Diffraction ; Fourier transforms ; Infrared absorption ; Infrared analysis ; Infrared spectra ; Intermetallic compounds ; Low temperature ; Manganese base alloys ; Physics ; Polarization ; Room temperature ; Sintering (powder metallurgy) ; Spectrometers ; Structural analysis ; Wavelengths ; X-ray diffraction ; X-rays
É parte de: Journal of physics. Conference series, 2014-01, Vol.534 (1), p.12022-3
Notas: ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
Descrição: High purity MnBi low temperature phase has been prepared and analyzed using X- ray diffraction, Lorentz-Polarization Factor and Fourier transforms infrared measurement. After synthesis of samples structural characterization has done on samples by X-ray diffraction, which shows that after making the bulk sample is in no single phase MnBi has been prepared by sintering Mn and Bi powder. The X-ray diffraction measurements were carried out using Bruker D8 Advance X-ray diffractometer. The X-rays were produced using a sealed tube and the wavelength of x-ray was 0.154nm (Cu K-alpha).and x-rays were detected using a fast counting detector based on Silicon strip technology (Bruker LynxEye detector). By Lorentz- Polarization Factor is affecting the relative intensity of diffraction lines on a powder form. The infrared absorption spectra of the alloys and intermetallic compound were measured at room temperature, in the wave number range 4000 to 400 cm−1 by a computerized spectrometer type Jasco FTIR-300 (JAPAN) using the KBr pellet technique. And by FTIR which shows absorption peaks of MnBi alloys.
Editor: Bristol: IOP Publishing
Idioma: Inglês

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XRD, LPF and FTIR investigation of Mn-Bi alloy

Mishra, Ashutosh ; Patil, Harsha ; Jain, Garima

Bristol: IOP Publishing

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