Strengthening Brittle Semiconductor Nanowires through Stacking Faults: Insights from in Situ Mechanical Testing

Chen, Bin ; Wang, Jun ; Gao, Qiang ; Chen, Yujie ; Liao, Xiaozhou ; Lu, Chunsheng ; Tan, Hark Hoe ; Mai, Yiu-Wing ; Zou, Jin ; Ringer, Simon P ; Gao, Huajian ; Jagadish, Chennupati

Nano letters, 2013-09, Vol.13 (9), p.4369-4373 [Periódico revisado por pares]

Washington, DC: American Chemical Society

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