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High resolution Single Particle Analysis by scanning electron microscopy: A new tool to investigate the mineral composition of agglutinated foraminifers

Bartholdy, J ; Leipe, T ; Frenzel, P ; Tauber, F ; Bahlo, R

Studia geologica Polonica, 2005-01, Vol.124, p.53-65 [Peer Reviewed Journal]

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Title:
High resolution Single Particle Analysis by scanning electron microscopy: A new tool to investigate the mineral composition of agglutinated foraminifers
Author: Bartholdy, J ; Leipe, T ; Frenzel, P ; Tauber, F ; Bahlo, R
Subjects: Marine
Is Part Of: Studia geologica Polonica, 2005-01, Vol.124, p.53-65
Notes: ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
Description: A high resolution Single Particle Analysis by scanning electron microscopy (SEM) and X-ray microanalysis is introduced as a new technique to investigate components of tests of aggluti- nated foraminifers. In a feasibility study, specimens of Nodulina dentaliniformis (Brady, 1881) from surface sediment of the Luebeck Bight (southwestern Baltic Sea) were investigated. A chemical mapping of a selected part of the surface of the last chamber as well as analysis of isolated foraminiferal shell grains and the ambient sediment were carried out. The investigations point to the non-selectivity of the foraminifer to use specific minerals but a selectivity to use specific grain sizes and shapes.
Language: English;Polish

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