Pulsed r.f.-glow-discharge time-of-flight mass spectrometry for fast surface and interface analysis of conductive and non-conductive materials

Hohl, M. ; Kanzari, A. ; Michler, J. ; Nelis, T. ; Fuhrer, K. ; Gonin, M.

Surface and interface analysis, 2006-04, Vol.38 (4), p.292-295 [Periódico revisado por pares]

Chichester, UK: John Wiley & Sons, Ltd

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