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Carrier transport properties of aluminum oxide/polypyrrole films doped with naphthalene-1,5-disulfonic acid

Campos, M. ; Nascente, P.A.P.

Synthetic metals, 2010-07, Vol.160 (13), p.1513-1519 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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Título:
Carrier transport properties of aluminum oxide/polypyrrole films doped with naphthalene-1,5-disulfonic acid
Autor: Campos, M. ; Nascente, P.A.P.
Assuntos: Aluminum ; Aluminum oxide ; Application fields ; Applied sciences ; Barriers ; Characteristics ; Compound structure devices ; Conducting polymer ; Current–voltage ; Density ; Electric potential ; Electrical properties ; Electronics ; Exact sciences and technology ; Gold ; Polymer industry, paints, wood ; Schottky barrier ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Technology of polymers ; Volt-ampere characteristics ; Voltage ; X-ray photoelectron spectroscopy
É parte de: Synthetic metals, 2010-07, Vol.160 (13), p.1513-1519
Notas: ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
Descrição: The electrical structure of the Al/Al 2O 3/PPy-NDSA/Au has been investigated by means of current–voltage ( I– V) and capacitance–voltage ( C– V) measurements, in a temperature range of 90–350 K. The forward C– V measurements have been carried out in the range of frequency of 1 kHz to 20 MHz. The effects of series resistance, interfacial layer and interface states on I– V and C– V characteristics are investigated. At high current densities in the forward direction, the series resistance effect has been observed for voltages greater than 0.7 V. The analysis of I– V characteristics based on the thermionic emission mechanism has been explained by the assumption of a Gaussian distribution of barrier heights, due to barrier height inhomogeneities that prevail at the interface. It has been observed that the forward C– V plot exhibits a peak, whose position shifts towards lower voltages and that decreases with increasing frequency. The non-linearity of 1/ C 2 versus V plot at high frequency was explained with the assumption that only some of the interface states follow the applied ac signal. Surface analysis by X-ray photoelectron spectroscopy (XPS) was performed in order to evaluate the chemical states of the constituents of the Al/Al 2O 3/PPy-NDSA/Au sample.
Editor: Amsterdam: Elsevier B.V
Idioma: Inglês

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Carrier transport properties of aluminum oxide/polypyrrole films doped with naphthalene-1,5-disulfonic acid

Campos, M. ; Nascente, P.A.P.

Amsterdam: Elsevier B.V

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