Cryogenic Characterization of FBK HD Near-UV Sensitive SiPMs

Acerbi, Fabio ; Davini, Stefano ; Ferri, Alessandro ; Galbiati, Cristiano ; Giovanetti, Graham ; Gola, Alberto ; Korga, George ; Mandarano, Andrea ; Marcante, Marco ; Paternoster, Giovanni ; Piemonte, Claudio ; Razeto, Alessandro ; Regazzoni, Veronica ; Sablone, Davide ; Savarese, Claudio ; Zappala, Gaetano ; Zorzi, Nicola

IEEE transactions on electron devices, 2017-02, Vol.64 (2), p.521-526 [Periódico revisado por pares]

New York: IEEE

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