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Application of Soft X-Ray Lasers to Neutral Cluster Chemistry

Bernstein, E. R. ; Dong, F. ; Guo, Y. Q. ; Shin, J.-W. ; Heinbuch, S. ; Rocca, J. J. Marconi, Mario ; Rocca, Jorge ; Menoni, Carmen

X-Ray Lasers 2014, p.359-367

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Título:
Application of Soft X-Ray Lasers to Neutral Cluster Chemistry
Autor: Bernstein, E. R. ; Dong, F. ; Guo, Y. Q. ; Shin, J.-W. ; Heinbuch, S. ; Rocca, J. J.
Marconi, Mario ; Rocca, Jorge ; Menoni, Carmen
Assuntos: Covalent Cluster ; Neutral Cluster ; Proton Transfer Reaction ; Single Photon Ionization ; Vanadium Oxide
É parte de: X-Ray Lasers 2014, p.359-367
Descrição: This presentation provides a review and overview of the chemical studies that are possible with the aid of a soft X-ray (EUV) laser. The laser operates from 1 to 10 Hz with an output energy/pulse of ~ 10 μJ at a wavelength of 46.9 nm (26.44 eV/photon). This cluster single photon ionization source is coupled to a time of flight mass spectrometer and is employed to study a large variety of neutral clusters to learn their distribution, reactions, and catalytic chemistry behavior. The presentation demonstrates the advantages of this apparatus through comparisons of mass spectra obtained with other laser ionization sources (6.4 and 10.5 eV/photon) for the same or comparable samples. The future directions for such studies are presented and a new photoelectron/mass spectrometer constructed around a soft X-ray/EUV photon source is planned and discussed.
Editor: Cham: Springer International Publishing
Idioma: Inglês

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