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Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction

Chamard, Virginie ; Stangl, Julian ; Labat, Stephane ; Mandl, Bernhard ; Lechner, Rainer T. ; Metzger, Till H.

Journal of applied crystallography, 2008-04, Vol.41 (2), p.272-280 [Revista revisada por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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Título:
Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction
Autor: Chamard, Virginie ; Stangl, Julian ; Labat, Stephane ; Mandl, Bernhard ; Lechner, Rainer T. ; Metzger, Till H.
Materias: coherent X-ray diffraction ; Condensed Matter ; Condensed Matter Physics ; Crystal structure ; Crystallography ; Den kondenserade materiens fysik ; Diffraction ; Fysik ; InAs ; micro-focusing ; Nanowires ; Natural Sciences ; Naturvetenskap ; Physical Sciences ; Physics ; stacking faults ; synchrotron radiation ; X-rays
Es parte de: Journal of applied crystallography, 2008-04, Vol.41 (2), p.272-280
Notas: istex:83E9F7851F8E2E837E40E20C05F4D25ED0BB78A0
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ArticleID:JCRFE5033
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
Descripción: InAs nanowire samples grown by metal‐organic chemical vapor deposition present a significant amount of wurtzite structure, while the zincblende lattice is known to be the stable crystal structure for the bulk material. The question of the wurtzite distribution in the sample is addressed using phase‐sensitive coherent X‐ray diffraction with a micro‐focused beam at a synchrotron source. The simultaneous investigation of the wurtzite , and reflections performed on a bunch of single wires shows unambiguously that the wurtzite contribution is a result of stacking faults distributed along the wire. Additional simulations lead to adjustments of the wire structural parameters, such as the wurtzite content, the strain distribution, the wire diameters and their respective orientations.
Editor: 5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography
Idioma: Inglés

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Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction

Chamard, Virginie ; Stangl, Julian ; Labat, Stephane ; Mandl, Bernhard ; Lechner, Rainer T. ; Metzger, Till H.

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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