Evidence of stacking-fault distribution along an InAs nanowire using micro-focused coherent X-ray diffraction

Chamard, Virginie ; Stangl, Julian ; Labat, Stephane ; Mandl, Bernhard ; Lechner, Rainer T. ; Metzger, Till H.

Journal of applied crystallography, 2008-04, Vol.41 (2), p.272-280 [Periódico revisado por pares]

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

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