Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Favre-Nicolin, V ; Mastropietro, F ; Eymery, J ; Camacho, D ; Niquet, Y M ; Borg, B M ; Messing, M E ; Wernersson, L-E ; Algra, R E ; Bakkers, E P A M ; Metzger, T H ; Harder, R ; Robinson, I K

New journal of physics, 2010-03, Vol.12 (3), p.035013 [Periódico revisado por pares]

IOP Publishing

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