Idioma:

Papers from the 10th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors

International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (10th 2003 Batz-sur-Mer, France) J. P Landesman (Jean-Pierre); P. C Montgomery (Paul C.)

Issued as: European physical journal. Applied physics v. 27, no. 27, no. 1-3 (July-Sept. 2004)

Localização: IF - Instituto de Física (Eur.Phys.J v.27 n.1-3 2004 )(Acessar)

Título:
Papers from the 10th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors
Autor: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (10th 2003 Batz-sur-Mer, France)
J. P Landesman (Jean-Pierre); P. C Montgomery (Paul C.)
Assuntos: Semiconductors -- Defects -- Congresses; SEMICONDUTORES (CONGRESSOS)
É parte de: Issued as: European physical journal. Applied physics v. 27, no. 27, no. 1-3 (July-Sept. 2004)
Notas: Includes bibliographical references and index.
Editor: Ulis Cedex A, France EDP Sciences
Data de criação/publicação: c2004
Formato: 514 p. ill. 28 cm.
Idioma: Inglês

Links

Voltar para lista de resultados

Anterior Resultado 3 Avançar Ir para próxima página