Estimation of the thickness and the optical parameters of several stacked thin films using optimization
Ricardo Luiz de Andrade Abrantes Ernesto Julian Goldberg Birgin; Ivan Chambouleyron; José Mário Martínez; Sergio D Ventura
Applied Optics Washington v. 47, n. 28, p. 5208-5220, 2008Washington 2008
Available at IME - Inst. Matemática e Estatística (PROD-1722632 )(GetIt)
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