Quantification of dissipation and deformation in ambient atomic force microscopy

• Autor: Santos, Sergio ; Gadelrab, Karim R ; Barcons, Victor ; Stefancich, Marco ; Chiesa, Matteo
• Assuntos: Atomic force microscopy ; Dissipative process ; Energy hysteresis ; Enginyeria electrònica ; Física ; Microscòpia de força atòmica ; Picometer resolution ; Sample deformation ; Unknown quantity ; Àrees temàtiques de la UPC
• É parte de: New journal of physics, 2012-07, Vol.14 (7), p.73044
• Descrição: A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the unknowns only requires the cantilever to be accurately calibrated and the dissipative processes occurring during sample deformation to be well modeled. The theory is validated by comparison with numerical simulations and shown to be able to provide, in principle, values of sample deformation with picometer resolution.
  
• Editor: IOP Publishing
  
• Idioma: Inglês