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Infrared Physics & Technology
| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Article
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Broad band infrared near-field spectroscopy at finger print region using SPring-8Ikemoto, Y. ; Moriwaki, T. ; Okamura, H. ; Sasaki, T. ; Yoneyama, N. ; Taguchi, A. ; Inouye, Y. ; Kawata, S. ; Kinoshita, T.Infrared physics & technology, 2008-05, Vol.51 (5), p.417-419 [Peer Reviewed Journal]Amsterdam: Elsevier B.VFull text available |
| 2 |
Material Type: Article
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Increasing FTIR spectromicroscopy speed and resolution through compressive imagingGallet, Julien ; Riley, Michael ; Hao, Zhao ; Martin, Michael C.Infrared physics & technology, 2008-05, Vol.51 (5), p.420-422 [Peer Reviewed Journal]Amsterdam: Elsevier B.VFull text available |
| 3 |
Material Type: Article
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Infrared characterization of localized corrosion productsMorikawa, Eizi ; Kizilkaya, Orhan ; Perkins, Richard S.Infrared physics & technology, 2008-05, Vol.51 (5), p.407-409 [Peer Reviewed Journal]Amsterdam: Elsevier B.VFull text available |
| 4 |
Material Type: Article
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BL43IR at SPring-8 redirectedMoriwaki, Taro ; Ikemoto, YukaInfrared physics & technology, 2008-05, Vol.51 (5), p.400-403 [Peer Reviewed Journal]Amsterdam: Elsevier B.VFull text available |
| 5 |
Material Type: Article
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Temperature dependence of infrared reflectance spectra of InNKurihara, K. ; Yanagawa, T. ; Nakagawa, N. ; Fukui, K. ; Yamamoto, A.Infrared physics & technology, 2008-05, Vol.51 (5), p.482-484 [Peer Reviewed Journal]Amsterdam: Elsevier B.VFull text available |
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