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0 − ↔ 0 + beta decay and muon capture in the A = 16 nuclei
0 − ↔ 0 + beta decay and muon capture in the A = 16 nuclei
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0 − ↔ 0 + beta decay and muon capture in the A = 16 nuclei

Bottino, A. ; Ciocchetti, G. ; Kim, C. W.

Physical review. C, Nuclear physics, 1977-01, Vol.16 (3), p.1120-1123

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2
(0 0 0 1) oriented GaN epilayer grown on [formula omitted] sapphire by MOCVD
(0 0 0 1) oriented GaN epilayer grown on [formula omitted] sapphire by MOCVD
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(0 0 0 1) oriented GaN epilayer grown on [formula omitted] sapphire by MOCVD

Bai, J. ; Wang, T. ; Li, H.D. ; Jiang, N. ; Sakai, S.

Journal of crystal growth, 2001-09, Vol.231 (1), p.41-47 [Peer Reviewed Journal]

Amsterdam: Elsevier B.V

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3
(0)-(0) = 0 [with Reply]
(0)-(0) = 0 [with Reply]
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(0)-(0) = 0 [with Reply]

Jagger, Janine ; Schulman, Kevin A.

Infection control and hospital epidemiology, 1994-08, Vol.15 (8), p.507-508 [Peer Reviewed Journal]

United States: SLACK Incorporated

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4
(0 0 1) Textured CoPt/Ag films and nanocomposites: the effect of Ag underlayers
(0 0 1) Textured CoPt/Ag films and nanocomposites: the effect of Ag underlayers
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(0 0 1) Textured CoPt/Ag films and nanocomposites: the effect of Ag underlayers

Manios, E. ; Karanasos, V. ; Niarchos, D. ; Panagiotopoulos, I.

Journal of magnetism and magnetic materials, 2004-05, Vol.272, p.2169-2170 [Peer Reviewed Journal]

Elsevier B.V

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5
(0 0 1) V surface structures analysed by RHEED and STM
(0 0 1) V surface structures analysed by RHEED and STM
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(0 0 1) V surface structures analysed by RHEED and STM

Dulot, F. ; Turban, P. ; Kierren, B. ; Eugène, J. ; Alnot, M. ; Andrieu, S.

Surface science, 2001-02, Vol.473 (3), p.172-182 [Peer Reviewed Journal]

Lausanne: Elsevier B.V

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6
[0 0 1] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(0 0 1)
[0 0 1] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(0 0 1)
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[0 0 1] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(0 0 1)

Liao, X.Z ; Zou, J ; Cockayne, D.J.H ; Matsumura, S

Ultramicroscopy, 2004, Vol.98 (2), p.239-247 [Peer Reviewed Journal]

Netherlands: Elsevier B.V

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7
0 + 0 = 2: Changeover of Stability and Photopolymerization Kinetics for the Rotator Phase of Long-Chain Acrylate through the Ultra-Addition Effect in Binary Systems
0 + 0 = 2: Changeover of Stability and Photopolymerization Kinetics for the Rotator Phase of Long-Chain Acrylate through the Ultra-Addition Effect in Binary Systems
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0 + 0 = 2: Changeover of Stability and Photopolymerization Kinetics for the Rotator Phase of Long-Chain Acrylate through the Ultra-Addition Effect in Binary Systems

Yao, Miao ; Nie, Jun ; He, Yong

Macromolecules, 2018-08, Vol.51 (15), p.5904-5910 [Peer Reviewed Journal]

American Chemical Society

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8
(0 0 2)-oriented growth and morphologies of ZnO thin films prepared by sol-gel method
(0 0 2)-oriented growth and morphologies of ZnO thin films prepared by sol-gel method
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(0 0 2)-oriented growth and morphologies of ZnO thin films prepared by sol-gel method

Guo, Dongyun ; Ju, Yang ; Fu, Chengju ; Huang, Zhixiong ; Zhang, Lianmeng

Materials science--Poland, 2016-09, Vol.34 (3), p.555-563 [Peer Reviewed Journal]

De Gruyter

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9
0+-0- Crossings in Electric Fields—A Possibility for Detecting Parity Violation in Helium
0+-0- Crossings in Electric Fields—A Possibility for Detecting Parity Violation in Helium
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0+-0- Crossings in Electric Fields—A Possibility for Detecting Parity Violation in Helium

Oppen, G. V

Europhysics letters, 1990-01, Vol.11 (1), p.25-30 [Peer Reviewed Journal]

IOP Publishing

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10
0–0 Energies Using Hybrid Schemes: Benchmarks of TD-DFT, CIS(D), ADC(2), CC2, and BSE/GW formalisms for 80 Real-Life Compounds
0–0 Energies Using Hybrid Schemes: Benchmarks of TD-DFT, CIS(D), ADC(2), CC2, and BSE/GW formalisms for 80 Real-Life Compounds
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0–0 Energies Using Hybrid Schemes: Benchmarks of TD-DFT, CIS(D), ADC(2), CC2, and BSE/GW formalisms for 80 Real-Life Compounds

Jacquemin, Denis ; Duchemin, Ivan ; Blase, Xavier

Journal of chemical theory and computation, 2015-11, Vol.11 (11), p.5340-5359 [Peer Reviewed Journal]

United States: American Chemical Society

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