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Refined by: resource type: Standards remove
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1
2002 - The Year in Review: Australia: pushing ahead with IAS
Material Type:
Standard
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2002 - The Year in Review: Australia: pushing ahead with IAS

Accountant, 2002, p.16

London: Lafferty Ltd

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2
2002 - The Year in Review: Canada: adopting preventative measures
Material Type:
Standard
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2002 - The Year in Review: Canada: adopting preventative measures

Accountant, 2002, p.14

London: Lafferty Ltd

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3
2002 - Year in Review: Mexico: rising late to address credibility issues
Material Type:
Standard
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2002 - Year in Review: Mexico: rising late to address credibility issues

Accountant, 2002, p.15

London: Lafferty Ltd

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4
An "annus horribilis" for the Netherlands
Material Type:
Standard
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An "annus horribilis" for the Netherlands

Accountant, 2003, p.16

London: Lafferty Ltd

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5
ASIA-PACIFIC: Wide ranging effect
Material Type:
Standard
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ASIA-PACIFIC: Wide ranging effect

Accountant, 2007, p.8

London: Lafferty Ltd

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6
B878 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
Material Type:
Standard
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B878 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

2014

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7
B878 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
Material Type:
Standard
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B878 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

2019

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8
B878 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
Material Type:
Standard
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B878 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

2009

Full text available

9
B878 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
Material Type:
Standard
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B878 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

2003

Full text available

10
B878 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
Material Type:
Standard
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B878 Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors

1998

Full text available

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